I have had an issue with my Qubes installation on my PC for a bit now. After typing in my LUKS password my PC would boot normally, except that at one point in the boot process it would run fsck (which it doesn’t normally do). It then always Kernel Panics a little later in the boot process. I used to be able to fix this issue by booting from my install medium, opening my system SSD, then running fsck on /dev/mapper/qubes_dom0-root. fsck would then ask me whether to fix the free blocks and free inodes count. Doing both fixed the issue.
Unfortunately, as of right now, this no longer works. Does anyone have any idea of what might be going on here? I’ve tried doing some research, but haven’t gotten very far. I sadly can’t seem to be able to upload an image of the Kernel Panic at the moment, the website just keeps saying it is processing the upload, and never finishes.
Which QubesOS and kernel version you have?
Issue appear after inplace upgrade of Qubes from 4.2.4 to 4.3?)
Which QubesOS and kernel version you have?
R4.3, Kernel 6.12.64-1 (according to my GRUB options)
Issue appear after inplace upgrade of Qubes from 4.2.4 to 4.3?)
No. This a fairly fresh install, maybe a month old, on a machine that has never had any version other than R4.3 on it. This happens randomly. I sometimes just shut down my computer, without anything out of the ordinary happening, and then when I start it back up again it I am met with a Kernel Panic.
Think that we need look over journalctl when issue take place.
You can check SSD health status?
Think that we need to look over journalctl when issue takes place.
Do you mean the journalctl output from the rescue environment or do you want to obtain journalctl output from the installation that kernel panics somehow?
You can check SSD health status?
The SSD is also only about a month old, SMART data looks good at least from my understanding. I’ve put the output of smartctl -x /dev/sda below if you want to take a look yourself. The rest of the hardware is fairly old though…
smartctl -x /dev/sda
smartctl 7.5 2025-04-30 r5714 [x86_64-linux-6.12.59-1.qubes.fc41.x86_64] (local build)
Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: EDILOCA ES106 1TB
Serial Number: 25121305552010085
Firmware Version: X0418B0
User Capacity: 1,024,209,543,168 bytes [1.02 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: Not in smartctl database 7.5/5852
ATA Version is: ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Mar 12 20:46:03 2026 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x11) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SCT capabilities: (0x0001) SCT Status supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O–CK 100 100 050 - 0
5 Reallocated_Sector_Ct -O–CK 100 100 050 - 0
9 Power_On_Hours -O–CK 100 100 050 - 52
12 Power_Cycle_Count -O–CK 100 100 050 - 159
160 Unknown_Attribute -O–CK 100 100 050 - 0
161 Unknown_Attribute PO–CK 100 100 050 - 100
163 Unknown_Attribute -O–CK 100 100 050 - 5
164 Unknown_Attribute -O–CK 100 100 050 - 2004
165 Unknown_Attribute -O–CK 100 100 050 - 4
166 Unknown_Attribute -O–CK 100 100 050 - 1
167 Unknown_Attribute -O–CK 100 100 050 - 2
168 Unknown_Attribute -O–CK 100 100 050 - 5050
169 Unknown_Attribute -O–CK 100 100 050 - 100
175 Program_Fail_Count_Chip -O–CK 100 100 050 - 0
176 Erase_Fail_Count_Chip -O–CK 100 100 050 - 0
177 Wear_Leveling_Count -O–CK 100 100 050 - 0
178 Used_Rsvd_Blk_Cnt_Chip -O–CK 100 100 050 - 0
181 Program_Fail_Cnt_Total -O–CK 100 100 050 - 0
182 Erase_Fail_Count_Total -O–CK 100 100 050 - 0
192 Power-Off_Retract_Count -O–CK 100 100 050 - 114
194 Temperature_Celsius -O—K 100 100 050 - 27
195 Hardware_ECC_Recovered -O–CK 100 100 050 - 0
196 Reallocated_Event_Count -O–CK 100 100 050 - 0
197 Current_Pending_Sector -O–CK 100 100 050 - 0
198 Offline_Uncorrectable -O–CK 100 100 050 - 0
232 Available_Reservd_Space -O–CK 100 100 050 - 100
241 Total_LBAs_Written ----CK 100 100 050 - 30205
242 Total_LBAs_Read ----CK 100 100 050 - 24008
245 Unknown_Attribute -O–CK 100 100 050 - 6675
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x24 GPL R/O 88 Current Device Internal Status Data log
0x25 GPL R/O 32 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 10 -
Selective Self-tests/Logging not supported
SCT Status Version: 3
SCT Version (vendor specific): 0 (0x0000)
Device State: Active (0)
Current Temperature: 27 Celsius
Power Cycle Min/Max Temperature: 27/27 Celsius
Lifetime Min/Max Temperature: 25/50 Celsius
Specified Max Operating Temperature: 100 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Data Table command not supported
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 159 — Lifetime Power-On Resets
0x01 0x010 4 52 — Power-on Hours
0x01 0x018 6 1979538740 — Logical Sectors Written
0x01 0x020 6 7421785 — Number of Write Commands
0x01 0x028 6 1573431781 — Logical Sectors Read
0x01 0x030 6 15195648 — Number of Read Commands
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 — Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x000a 4 3 Device-to-host register FISes sent due to a COMRESET
Yea, at the moment I don’t know what could be the reason.
Also you can search over forum and look for similar behavior reported by someone else.